Número de pieza S250

Semiconductor Device Test Set

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Número de pieza
Desmilitarización
Vigencia
UOM
NIIN
Número de pieza:
s250
Desmilitarización:
No
Vigencia:
N/A
Unidad de medida:
1 EA
NIIN:
012010653
NSN
Número de acciones nacionales:
6625-01-201-0653 6625012010653
TXT
Descripción:
Semiconductor Device Test Set
INC
INC
Código de nombre del artículo:
25006
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
115.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
60.0 hertz
MRC:
The principal parts that are included in an assembled unit.AEAS
Major Components:
Vmicrozoom microscope S-930V finemotion micropositioner; sm-sp spung loaded probe tip holder se-tz 5 micron tungsten probe tip SE-10TZ 1 micron tungsten probe tip S-2715 socket card adapter s-vac vacuum pump W/10 ft Oftubing
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Submicron geometry of integrated circuit chips

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