Número de pieza HTR1005B-1ES

Semiconductor Device Test Set

Precios y disponibilidad

Envíe este formulario para conocer los precios actuales y la disponibilidad de esta NSN.
Número de pieza:
Cantidad:
Dirección de correo electrónico:
Teléfono:
Referencia:
Compañía:
Nombre:

No compartimos ni vendemos su información a nadie.
Privacidad | Letra chica

All major credit cards accepted as well as gov. p-cards
Número de pieza
Desmilitarización
Vigencia
UOM
NIIN
Número de pieza:
htr1005b-1es
Desmilitarización:
No
Vigencia:
Unidad de medida:
NIIN:
012163258
NSN
Número de acciones nacionales:
6625-01-216-3258 6625012163258
TXT
Descripción:
Semiconductor Device Test Set
INC
INC
Código de nombre del artículo:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
250.0 millimeters
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
220.00 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
286.0 millimeters
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
In-circuit testing of componets
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
86.0 millimeters

Similar Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments Catálogo
Comparar ahora»
Claro | Esconder