Número de pieza 1731-9700

Semiconductor Device Test Set

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Número de pieza
Desmilitarización
Vigencia
UOM
NIIN
Número de pieza:
1731-9700
Desmilitarización:
No
Vigencia:
N/A
Unidad de medida:
1 EA
NIIN:
012575258

Información de la pieza
Display includes both pass/fail led and a range of video display modes includes keyboard and mass storage RS232 and IEEE-488 interfaces

NSN
Número de acciones nacionales:
6625-01-257-5258 6625012575258
TXT
Descripción:
Semiconductor Device Test Set
INC
INC
Código de nombre del artículo:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
19.000 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
110.0 volts and 125.0 volts and 216.0 volts and 250.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
25.000 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Microcomputer controlled ram based test system for high throughput testing of the full range of linear devices
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
12.500 inches
MRC:
Characteristics or qualities of an item,not covered in any other requirement,which are considered essential information for one or more functions excluding nsn assignment.SUPP
Supplementary Features:
Manufacturers name: linear ic test system

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