Número de pieza
Desmilitarización
Vigencia
UOM
NIIN
NSN
Número de acciones nacionales:
TXT
Descripción:
Semiconductor Device Test Set
Código de nombre del artículo:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
6.000 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
8.187 inches
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Front resistance of crystal back resistance of crystal back current of crystal
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Front resistance-not greater than 0.5 kilohm for a good crystal back resistance-ratio of back to front resistance greater than 10 to 1 for a good crystal back current-crystal should not indicate current greater than - crystal IN21 and IN23, IN23A, IN25, IN21A and IN23B, IN21B, IN26 we IN26 syl IN78 syl - current d C 0.400 ma 0.300 ma 0.250 ma 0.175 ma 0.125 ma 0.110 ma 0.230 ma 0.160 ma
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
3.625 inches
